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Proceedings Paper

Implementation of the "CLEAN" algorithm on microwave images for nondestructive testing
Author(s): Solomon R. Ghorayeb; Mark T. Lusk
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Paper Abstract

An intuitive deconvolution algorithm known s CLEAN is considered as a means of improving images associated with microwave nondestructive evaluation (NDE). Flawed metallic surfaces are scanned using a continuous wave (cw), X-band synthetic aperture radar (SAR), and images are produced using a synthetic-aperture focusing algorithm. The results are compared with those obtained by further processing the data using the CLEAN algorithm. The utility of adopting such a scheme to improve flaw detection is discussed.

Paper Details

Date Published: 14 September 1994
PDF: 9 pages
Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); doi: 10.1117/12.186706
Show Author Affiliations
Solomon R. Ghorayeb, Iowa State Univ. (United States)
Mark T. Lusk, Iowa State Univ. (United States)

Published in SPIE Proceedings Vol. 2275:
Advanced Microwave and Millimeter-Wave Detectors
Satish S. Udpa; Hsiu C. Han, Editor(s)

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