Share Email Print
cover

Proceedings Paper

New concepts for microwave sensing
Author(s): Jean-Charles Bolomey
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For a long time, microwaves have been considered as a possible sensing agent for nondestructive testing/evaluation purposes. This trend has still been reinforced these last years with the advent of new microwave penetrable materials, such as composites. Inspection of materials via a mechanically scanned probe has proven to offer a convenient, but time consuming, way to measure local reflexion or transmission coefficients and, hence, to evaluate defects, faults, etc... High speed measurements are now possible by using arrays of fixed probes, resulting in attractive imaging equipments. Indeed, the availability of amplitude/phase data allows us to consider different processing techniques, the complexity of which can be selected according to the required performances in terms of contrast, spatial and time resolutions. This paper reviews some of the most promising approaches, such as non-linear inverse scattering techniques and neural networks. Prospective considerations are devoted to the future of such sophisticated microwave sensing techniques.

Paper Details

Date Published: 14 September 1994
PDF: 9 pages
Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); doi: 10.1117/12.186703
Show Author Affiliations
Jean-Charles Bolomey, Supelec (France)


Published in SPIE Proceedings Vol. 2275:
Advanced Microwave and Millimeter-Wave Detectors
Satish S. Udpa; Hsiu C. Han, Editor(s)

© SPIE. Terms of Use
Back to Top