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Proceedings Paper

Polarization sensitivity modeling of reflective imaging systems
Author(s): Conrad Wells
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Paper Abstract

Polarization modeling of imaging systems has assumed more importance in recent earth remote sensing systems. Santa Barbara Research Center (SBRC) has developed computer programs that model the polarization characteristics of optical systems. This single ray simplified approach can be used when coating design information is not available or for modeling of an as built instrument using measured component data. For systems without exotic coating designs, the polarization ray trace capability of the optical design program CodeV is used to perform polarization modeling. Two polarization modeling case studies are reported. Measured component data is used for single ray modeling of the Moderate Resolution Imaging Spectroradiometer (MODIS) sensor currently being built at SBRC. CodeV was used to model the full bundle of a five mirror off axis unobstructed ground based calibrator.

Paper Details

Date Published: 14 September 1994
PDF: 6 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186675
Show Author Affiliations
Conrad Wells, Santa Barbara Research Ctr. (United States)


Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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