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Proceedings Paper

Progress in polarization ray tracing
Author(s): Russell A. Chipman
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Paper Abstract

Polarization ray tracing is a collection of methods that extend geometrical ray tracing allowing the calculation of the evolution of polarization states along ray paths and the determination of the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and 3D polarization ray tracing calculi, examining the issues of local vs. global coordinates, amplitude vs. phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.

Paper Details

Date Published: 14 September 1994
PDF: 11 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186662
Show Author Affiliations
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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