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Proceedings Paper

Polarimetry and scatterometry using a Wollaston polarimeter
Author(s): Conrad Wells; Samuel F. Pellicori; Mike Pavlov
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Paper Abstract

A high precision polarimeter based on a dual-beam analyzer prism is capable of polarimetric accuracy's near +0.2% over the visible to near-IR range. Accuracy's were determined using computed Fresnel polarizances from fused silica at several incidence angles. A comparison of polarization measurements made at several different laboratories is presented.

Paper Details

Date Published: 14 September 1994
PDF: 8 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186658
Show Author Affiliations
Conrad Wells, Santa Barbara Research Ctr. (United States)
Samuel F. Pellicori, Pellicori Optical Consulting (United States)
Mike Pavlov, Santa Barbara Research Ctr. (United States)

Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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