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Proceedings Paper

Periodic and quasiperiodic nonquarterwave multilayer coating for 90-deg reflection phase retardance at 45-deg angle of incidence
Author(s): Mostofa M. K. Howlader; Rasheed M. A. Azzam
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Paper Abstract

All possible solutions for a periodic stack of 10 ZnS-ThF4 bilayers on a Ag substrate that produce 90 degree(s) differential reflection phase shift at 45 degree(s) angle of incidence and 3.39- micrometers wavelength are determined. The angular and wavelength sensitivity of several of these designs is considered. To increase the reflectance, reduce the diattenuation, and improve the sensitivity of the 20-layer reflection quarter-wave retarder (QWR), we also consider quasiperiodic stacks. These designs are obtained by iteration starting from an initial high- reflectance 10-bilayer, non-QWR, periodic structure and adjusting the thicknesses of the two films of the topmost bilayer to realize the desired 90 degree(s) retardance. Again multiple solutions are obtained for each initial design and their angular and wavelength sensitivity are analyzed. It is found that the best sensitivity corresponds to the lowest and nearly equal optical thicknesses of the two films of the topmost bilayer. Performance comparable to that reported in the literature, obtained for more complicated stacks in which the thicknesses of all 20 films are different, are reported.

Paper Details

Date Published: 14 September 1994
PDF: 13 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186656
Show Author Affiliations
Mostofa M. K. Howlader, Univ. of New Orleans (United States)
Rasheed M. A. Azzam, Univ. of New Orleans (United States)

Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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