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Proceedings Paper

Novel material for visible-blind UV detectors
Author(s): Mira Misra; Chris Zhou; Paul R. Bennett; Michael R. Squillante; Frank I. Ahmed
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Paper Abstract

Boron nitride phosphide (BNxP1-x) films were grown on single crystal GaAs, using chemical vapor deposition. The films were smooth, well adhered to the substrate and exhibited resistivities on the order of 1011 ohm-cm. Photoconductive detectors fabricated from these films showed quantum efficiencies of 33% and 40% at 254 nm and 365 nm respectively, with a drop of an order of magnitude at wavelengths greater than 400 nm. These measurements demonstrate the potential of BNxP1-x as a material for visible- blind UV detectors.

Paper Details

Date Published: 14 September 1994
PDF: 8 pages
Proc. SPIE 2282, Ultraviolet Technology V, (14 September 1994); doi: 10.1117/12.186630
Show Author Affiliations
Mira Misra, Radiation Monitoring Devices Inc. (United States)
Chris Zhou, Radiation Monitoring Devices Inc. (United States)
Paul R. Bennett, Radiation Monitoring Devices Inc. (United States)
Michael R. Squillante, Radiation Monitoring Devices Inc. (United States)
Frank I. Ahmed, Devcom Inc. (United States)

Published in SPIE Proceedings Vol. 2282:
Ultraviolet Technology V
Robert E. Huffman; Christos G. Stergis, Editor(s)

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