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Optical backgrounds prediction and analysis codes (OBPAC): a software package for modeling of space-borne optical sensor data
Author(s): James E. Bishop; Douglas J. Strickland; Carolyn Biczel; Robin J. Cox; Donald E. Anderson Jr.; Gerald J. Romick
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Paper Abstract

OBPAC is a software package designed to give a general user execution control over a suite of well-tested first principles and empirical modeling codes for atmospheric radiances; the GUI includes modules for visual examination of model results and archival to user-created databases. The calculations and visual displays are tailored to specific situations via a wide variety of inputs. The primary end-results are radiance spectra spanning the wavelength range 110 - 1000 nm at 0.1 nm resolution along user-specified look directions, from which limb profiles over user-specified wavelength intervals are derived; for both, the specific emission components underlying the total radiance can be displayed. In addition, various model inputs and intermediate results are available for graphical inspection. OBPAC has been developed for the prediction and analysis of satellite data acquired with a spectrographic imaging system (SPIMS); procedures for converting model radiances to SPIMS output are also included to facilitate experiment planning. OBPAC is presently limited to dayglow and Rayleigh-aerosol scattering radiances. In this paper, the suite of codes included within OBPAC is described and examples of the application of the package are presented.

Paper Details

Date Published: 14 September 1994
PDF: 9 pages
Proc. SPIE 2282, Ultraviolet Technology V, (14 September 1994); doi: 10.1117/12.186616
Show Author Affiliations
James E. Bishop, Computational Physics, Inc. (United States)
Douglas J. Strickland, Computational Physics, Inc. (United States)
Carolyn Biczel, Computational Physics, Inc. (United States)
Robin J. Cox, Computational Physics, Inc. (United States)
Donald E. Anderson Jr., Johns Hopkins Univ. (United States)
Gerald J. Romick, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 2282:
Ultraviolet Technology V
Robert E. Huffman; Christos G. Stergis, Editor(s)

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