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Proceedings Paper

Backgrounds Data Center
Author(s): William A. Snyder; Herbert Gursky; Harry M. Heckathorn; Bob L. Lucke; Bryan N. Dorland; R. A. Kessel; S. L. Berg; E. G. Dombrowski
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Paper Abstract

The Backgrounds Data Center (BDC) is the designated archive for backgrounds data collected by Ballistic Missile Defense Organization (BMDO) programs, some of which include ultraviolet sensors. Currently, the BDC holds ultraviolet data from the IBSS, UVPI, UVLIM, and FUVCAM sensors. The BDC will also be the prime archive for Midcourse Space Experiment (MSX) data and is prepared to negotiate with program managers to handle other datasets. The purpose of the BDC is to make data accessible to users and to assist them in analyzing it. The BDC maintains the Science Catalog Information Exchange System (SCIES) allowing remote users to log in, read or post notices about current programs, search the catalogs for datasets of interest, and submit orders for data. On-site facilities are also available for the analysis of data, and consist of VMS and UNIX workstations with access to software analysis packages such as IDL, IRAF, and Khoros. Either on-site or remotely, users can employ the BDC-developed graphical user interface called the Visual Interface for Space and Terrestrial Analysis (VISTA) to generate catalog queries and to display and analyze data. SCIES and VISTA permit nearly complete access to BDC services and capabilities without the need to be physically present at the data center.

Paper Details

Date Published: 14 September 1994
PDF: 8 pages
Proc. SPIE 2282, Ultraviolet Technology V, (14 September 1994); doi: 10.1117/12.186615
Show Author Affiliations
William A. Snyder, Naval Research Lab. (United States)
Herbert Gursky, Naval Research Lab. (United States)
Harry M. Heckathorn, Naval Research Lab. (United States)
Bob L. Lucke, Naval Research Lab. (United States)
Bryan N. Dorland, Naval Research Lab. (United States)
R. A. Kessel, Naval Research Lab. (United States)
S. L. Berg, Computational Physics, Inc. (United States)
E. G. Dombrowski, SFA, Inc. (United States)


Published in SPIE Proceedings Vol. 2282:
Ultraviolet Technology V
Robert E. Huffman; Christos G. Stergis, Editor(s)

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