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Proceedings Paper

Removing line patterns from infrared and passive millimeter wave images
Author(s): Alan H. Lettington; Qi He Hong; David G. Gleed
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Paper Abstract

This paper is concerned with removing a typical noise artifact: the line patterns that arise from the use of parallel detector channels in an imager. There is an advantage in using a number of parallel scanned radiometers in order to reduce the frame time of an imager, but the response of these channels tends to be non-uniform and produces regular scan lines in the image. This effect may conceal important image details and reduce the signal to noise ratio in the image with the result that image restoration algorithms are not as effective as they could be. A number of efficient methods have been developed to remove these scan lines, either in real space or in the Fourier domain. These techniques can be applied to both infrared and millimeter wave systems and their effectiveness has been demonstrated by practical examples.

Paper Details

Date Published: 21 September 1994
PDF: 7 pages
Proc. SPIE 2298, Applications of Digital Image Processing XVII, (21 September 1994); doi: 10.1117/12.186531
Show Author Affiliations
Alan H. Lettington, Univ. of Reading (United Kingdom)
Qi He Hong, Univ. of Reading (United Kingdom)
David G. Gleed, Defence Research Agency Malvern (United Kingdom)


Published in SPIE Proceedings Vol. 2298:
Applications of Digital Image Processing XVII
Andrew G. Tescher, Editor(s)

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