Share Email Print

Proceedings Paper

Logarithmically variable infrared etalon filters
Author(s): Kenneth P. Rosenberg; Karen D. Hendrix; Donald E. Jennings; Dennis C. Reuter; Murzy D. Jhabvala; Anh T. La
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Due to high launch vehicle costs, space instrumentation designers are constantly pressured to decrease weight and increase reliability of flight hardware. To meet these needs in a spectrometer, the infrared products team at Optical Coating Laboratory, Inc. (OCLI) and the NASA Goddard Space Flight Center (GSFC) have developed an infrared logarithmically variable filter for use in NASA's Pluto Fast Fly-by instrument. The filter and diode array combination replaces the multiple optical elements in conventional spectrometers, resulting in lower instrumentation weight and complexity with no moving parts. The choice of logarithmic rather than linear profile yields constant resolving power on every pixel of the array. Filters were produced in which the center wavelength varied from 1.0-1.581 micrometers , and 1.581-2.5 micrometers over a distance of 1.024 cm. Bandwidth was 0.3% FWHM and overall transmittance ranged from 30% to 50%. This paper discusses the major issues and tradeoffs in the design, manufacture, and testing of the filters. Measurement techniques are presented and comparisons are made between theoretical and measured performance of bandwidth, transmittance, and spectral profile.

Paper Details

Date Published: 7 September 1994
PDF: 10 pages
Proc. SPIE 2262, Optical Thin Films IV: New Developments, (7 September 1994); doi: 10.1117/12.185804
Show Author Affiliations
Kenneth P. Rosenberg, Optical Coating Lab. Inc. (United States)
Karen D. Hendrix, Optical Coating Lab. Inc. (United States)
Donald E. Jennings, NASA Goddard Space Flight Ctr. (United States)
Dennis C. Reuter, NASA Goddard Space Flight Ctr. (United States)
Murzy D. Jhabvala, NASA Goddard Space Flight Ctr. (United States)
Anh T. La, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 2262:
Optical Thin Films IV: New Developments
James D. Rancourt, Editor(s)

© SPIE. Terms of Use
Back to Top