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Proceedings Paper

Optical scattering and microstructure of ion beam deposited metal coatings
Author(s): Ghanim A. Al-Jumaily; Nasrat A. Raouf; Samad M. Edlou; John C. Simons
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Paper Abstract

Thin films of gold and platinum have been deposited onto super-polished fused silica substrates using thermal evaporation, ion assisted deposition (IAD), sputtering and ion assisted sputtering. The influence of ion beam flux, coating material and deposition rate on the films microroughness have been investigated. Coatings of gold and platinum have been bombarded with low energy (10-20 eV) Ar ions from an electron cyclotron resonance (ECR) ion source during deposition. Short range surface microroughness of coated surfaces has been examined using scanning tunneling microscopy (STM) and atomic force microscopy (AFM), while long range surface microroughness has been characterized using an angle resolved optical scatterometer. Results indicate that bombardment with low energy ions cause significant reduction in microroughness of metal coatings.

Paper Details

Date Published: 7 September 1994
PDF: 10 pages
Proc. SPIE 2262, Optical Thin Films IV: New Developments, (7 September 1994); doi: 10.1117/12.185780
Show Author Affiliations
Ghanim A. Al-Jumaily, Jet Propulsion Lab. (United States)
Nasrat A. Raouf, Jet Propulsion Lab. (United States)
Samad M. Edlou, Barr Associates, Inc. (United States)
John C. Simons, Barr Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 2262:
Optical Thin Films IV: New Developments
James D. Rancourt, Editor(s)

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