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Proceedings Paper

Optical properties and morphology of thin sputtered silver layers
Author(s): Lothar Herlitze; Rolf Blessing; Andreas Gombert; Wolfgang Graf; Michael Koehl
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Paper Abstract

Thin silver layers are frequently used as the infrared reflecting component of low-e coatings. The optimum thickness of the layer must be found by maximizing the IR-reflectance and the visible transmittance. Since the optimum demands a very thin silver layer, the condensation and nucleation of the silver on the respective substrate or interface is very important. The subject of this study was the sputter deposition of silver on different substrate materials: float glass, tin oxide and bismuth oxide. The optical properties of the layers were measured spectroscopically from UV to IR. The topography of the layers was investigated by scanning force microscopy. The measurements exhibit significant differences depending on the substrate material.

Paper Details

Date Published: 9 September 1994
PDF: 9 pages
Proc. SPIE 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, (9 September 1994); doi: 10.1117/12.185395
Show Author Affiliations
Lothar Herlitze, Interpane EuB (Germany)
Rolf Blessing, Interpane EuB (Germany)
Andreas Gombert, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Wolfgang Graf, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Michael Koehl, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)

Published in SPIE Proceedings Vol. 2255:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII
Volker Wittwer; Claes G. Granqvist; Carl M. Lampert, Editor(s)

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