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Proceedings Paper

Physical characterization methods of selective absorber layers
Author(s): P. Oelhafen; P. Gantenbein; R. Gampp
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Paper Abstract

The characterization of primary physical and chemical properties of various thin films prepared by plasma assisted deposition techniques for selective absorber layers is discussed with special emphasis on photoelectron spectroscopy. The materials of interest here consist of an amorphous hydrogenated carbon matrix in which metallic or carbidic clusters are embedded.

Paper Details

Date Published: 9 September 1994
PDF: 15 pages
Proc. SPIE 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, (9 September 1994); doi: 10.1117/12.185358
Show Author Affiliations
P. Oelhafen, Univ. Basel (Switzerland)
P. Gantenbein, Univ. Basel (Switzerland)
R. Gampp, Univ. Basel (Switzerland)


Published in SPIE Proceedings Vol. 2255:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII
Volker Wittwer; Claes G. Granqvist; Carl M. Lampert, Editor(s)

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