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Proceedings Paper

Electronic speckle pattern interferometrie through shearography
Author(s): Bernd Schulz
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Paper Abstract

Measurement systems based on image processing are used more and more in quality control. With aid of the interference ability of laserlight it is possible to gain the lost third dimension of 'normal' images in form of a phase relation. At the Lehrstuhl fur Feingeratebau der TU Munchen an electronic-speckle-pattern-interferometry (ESPI)-camera was constructed and continuously developed. The new arrangement enables to evaluate vibrations and deformations by ESPI and by Shearing Interferometry. Enjoyable are also the small dimensions of the camera.

Paper Details

Date Published: 8 September 1994
PDF: 5 pages
Proc. SPIE 2358, First International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (8 September 1994); doi: 10.1117/12.185340
Show Author Affiliations
Bernd Schulz, Technische Univ. Muenchen (Germany)


Published in SPIE Proceedings Vol. 2358:
First International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

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