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Proceedings Paper

Selection of materials for soft x-ray (SXR) and extreme ultraviolet (EUV) filters for space astronomy and other applications
Author(s): Forbes R. Powell; Virginia Ann Drake; Bill R. Sandel; Donald G. Mitchell
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Paper Abstract

This paper briefly reviews the more traditional materials that have been used for Soft X-Ray (SXR) and Extreme Ultraviolet (EUV) filters and then discusses several applications where new multilayer combinations of materials are being employed. The new applications include projection lithography and the detection of Energetic Neutral Atom (ENA) populations from spacecraft. Also briefly discussed is the use of polyimides for spacecraft filters.

Paper Details

Date Published: 13 September 1994
PDF: 11 pages
Proc. SPIE 2209, Space Optics 1994: Earth Observation and Astronomy, (13 September 1994); doi: 10.1117/12.185281
Show Author Affiliations
Forbes R. Powell, Luxel Corp. (United States)
Virginia Ann Drake, Univ. of Arizona (United States)
Bill R. Sandel, Univ. of Arizona (United States)
Donald G. Mitchell, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 2209:
Space Optics 1994: Earth Observation and Astronomy
Guy Cerutti-Maori; Philippe Roussel, Editor(s)

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