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Proceedings Paper

Experimental determination of mode fields in InP waveguides from measured intensity profiles using optimized deconvolution algorithms
Author(s): M. Halfmann; G. Kessler; Walter E. Heinlein
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Paper Abstract

Mode fields of integrated optical waveguides based on Indium Phosphide (InP) have been determined from near-field intensity measurements obtained by scanning the front face of a waveguide two-dimensionally in the focal plane of a microscope lens. Due to diffraction the focal spot size of this microscope lens (NA equals 0.9) is limited to approximately 2 micrometers at (lambda) equals 1550 nm. The original mode field of the integrated waveguide can be restored by deconvolving the measured intensity profile with the effective focal spot of the scanning lens. Therefore the iterative deconvolution algorithms of Jansson (1984) and Gold (1964) have been expanded and optimized for 2D applications. In order to reduce the numerical effort of these 2D algorithms a novel deconvolution algorithm based on one-dimensional Hankel transform instead of two-dimensional Fourier transform has been developed. The numerical evaluation of these deconvolution algorithms shows a rms-error of less than 1% with an assumed signal to noise ratio of 100:1. Applying these algorithms to measured intensity profiles and comparing the deconvolved fields to the numerically calculated Eigenmode field leads to a maximum difference of less than 10%, which may be caused by the fact that neither the geometric dimensions nor the refractive indices of the examined waveguide are known exactly.

Paper Details

Date Published: 25 August 1994
PDF: 8 pages
Proc. SPIE 2212, Linear and Nonlinear Integrated Optics, (25 August 1994); doi: 10.1117/12.185107
Show Author Affiliations
M. Halfmann, Univ. Kaiserslautern (Germany)
G. Kessler, Univ. Kaiserslautern (Germany)
Walter E. Heinlein, Univ. Kaiserslautern (Germany)

Published in SPIE Proceedings Vol. 2212:
Linear and Nonlinear Integrated Optics
Giancarlo C. Righini; David Yevick, Editor(s)

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