Share Email Print

Proceedings Paper

Structural modifications of sintered aluminum nitride ceramics resulting from excimer laser irradiation
Author(s): Alain Jadin; K. Starbova; Konstantin Kolev; Lucien Diego Laude; V. Hanot; T. Robert
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Due to their unique physical properties (high thermal conductivity, high electrical resistivity) aluminum nitride (AlN) ceramics are attractive materials for applications in electronics and other medium or high power electrical networking. In this contribution, the change of surface configuration of sintered AlN plates is studied as a function of excimer laser irradiation conditions (fluence, number of pulses). Before irradiation, Auger Electron Spectroscopy reveals a surface composition which is characteristic of the AlN synthesis process, i.e. N, O and C atoms are present, without any evidence for Al. At high laser fluences, irreversible decomposition of AlN takes place, producing free Al atoms at the surface. At low fluence, long-term and reversible modifications are detected, leading to the formation of metastable nitrogen oxides. The kinetics of these laser-induced reversible modifications is analyzed and a model is proposed to support these experimental evidences and to explain the AlN permanent decomposition.

Paper Details

Date Published: 7 September 1994
PDF: 7 pages
Proc. SPIE 2207, Laser Materials Processing: Industrial and Microelectronics Applications, (7 September 1994); doi: 10.1117/12.184775
Show Author Affiliations
Alain Jadin, Univ. of Mons (Belgium)
K. Starbova, Univ. of Mons (Belgium)
Konstantin Kolev, Univ. of Mons (Belgium)
Lucien Diego Laude, Univ. of Mons (Belgium)
V. Hanot, Univ. of Mons (Belgium)
T. Robert, Univ. of Mons (Belgium)

Published in SPIE Proceedings Vol. 2207:
Laser Materials Processing: Industrial and Microelectronics Applications
Eckhard Beyer; Maichi Cantello; Aldo V. La Rocca; Lucien Diego Laude; Flemming O. Olsen; Gerd Sepold, Editor(s)

© SPIE. Terms of Use
Back to Top