Share Email Print

Proceedings Paper

Enhancing the absorption of aluminum alloys by irradiation with an excimer laser
Author(s): Graeme Scott; Stewart W. Williams; P. C. Morgan; M. Dempster
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Aluminum alloys typically have as received reflectivities of 85 - 95% at 10.6 micrometers making many laser processes difficult or impossible. These values have been reduced to as low as 1 - 2% by optimizing the processing parameters of an excimer laser used to modify the surface structure of 8090 and 2024 Al alloys and pure Al prior to their exposure to a CO2 laser. The most significant excimer processing parameters were found to be the scan pattern of the excimer beam, the number of pulses per scan pattern step (dwell time) and the laser fluence. Optimizing these parameters allows the production of a rough oxide rich surface and reflectivities at 10.6 micrometers routinely below 10%. Preliminary results are presented from the practical implementation of the technique to a dual wavelength (CO2/excimer) cutting system. Increases in cutting speeds of between 2 - 4 times are demonstrated with 8090 Al-Li alloy using dual wavelength laser processing.

Paper Details

Date Published: 7 September 1994
PDF: 10 pages
Proc. SPIE 2207, Laser Materials Processing: Industrial and Microelectronics Applications, (7 September 1994); doi: 10.1117/12.184770
Show Author Affiliations
Graeme Scott, British Aerospace (Operations) Ltd. (United Kingdom)
Stewart W. Williams, British Aerospace (Operations) Ltd. (United Kingdom)
P. C. Morgan, British Aerospace (Operations) Ltd. (United Kingdom)
M. Dempster, British Aerospace (Operations) Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 2207:
Laser Materials Processing: Industrial and Microelectronics Applications
Eckhard Beyer; Maichi Cantello; Aldo V. La Rocca; Lucien Diego Laude; Flemming O. Olsen; Gerd Sepold, Editor(s)

© SPIE. Terms of Use
Back to Top