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Proceedings Paper

Minimum visible retinal lesions from pico- and femtosecond laser pulses
Author(s): William P. Roach; Cynthia A. Toth; Cindy D. Stein; Gary D. Noojin; David J. Stolarski; Clarence P. Cain
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Paper Abstract

Threshold measurements for Minimum Visible Lesions (MVL) at the retina are reported for femtosecond (fs) and picosecond (ps) laser pulses in Rhesus monkey eyes using visible wavelengths. The 50% probability for damage (ED50) dosages are calculated for 1 hour and 24 hour post-exposures at the 95% confidence level. The ED50 values are found to decrease with pulsewidth down to 600 fs. At 90 fs the ED50 dosages were noted to increase slightly when compared with the 3 ps and 600 fs values. Fluorescein angiography (FA) was accomplished at both 1 hour and 24 hour post-exposure and did not demonstrate lower threshold for damage, which has been the case for MVL's created with longer pulse durations (>= nanoseconds). At the 90 fs pulse duration, MVLs were not observed below 0.1 (mu) J. At energies greater than 0.1 (mu) J, both MVL and the absence of MVL's were observed up to 1.4 (mu) J. Above 1.4 (mu) J all energies delivered showed MVL development. Out of 138 data points taken at 90 fs, 94 were between 0.1 and 14 (mu) J, and the observed lesions are distributed with approximately 50% probability throughout this energy rate.

Paper Details

Date Published: 17 August 1994
PDF: 12 pages
Proc. SPIE 2134, Laser-Tissue Interaction V; and Ultraviolet Radiation Hazards, (17 August 1994); doi: 10.1117/12.182931
Show Author Affiliations
William P. Roach, Air Force Armstrong Lab. (United States)
Cynthia A. Toth, Duke Univ. Eye Ctr. (United States)
Cindy D. Stein, Air Force Armstrong Lab. (United States)
Gary D. Noojin, The Analytic Sciences Corp. (United States)
David J. Stolarski, The Analytic Sciences Corp. (United States)
Clarence P. Cain, The Analytic Sciences Corp. (United States)


Published in SPIE Proceedings Vol. 2134:
Laser-Tissue Interaction V; and Ultraviolet Radiation Hazards
Steven L. Jacques; David H. Sliney; Michael Belkin, Editor(s)

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