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Proceedings Paper

Characterization of MBE-grown ultrathin films in the La2-xSrxCuO4+ or minus delta system
Author(s): Yvan Jaccard; Andreas Cretton; Erica J. Williams; Jean-Pierre Locquet; Erich Maechler; Christoph Gerber; Toni Schneider; Oystein Fischer; Piero Martinoli
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Paper Abstract

Using a molecular beam epitaxy deposition technique, c-axis La2-xSrxCuO4+/- (delta ) ultrathin films have been prepared on (001) SrTiO3 substrates. Several superconductive properties such as the critical temperature Tc, the penetration depth (lambda) ab(0), the activation energy for flux flow (Delta) U and the Hall coefficient RH are reported for the same set of films. As the dopant content is increased, maximum values for Tc and (Delta) U are observed near the optimum doping while RH decreases continuously.

Paper Details

Date Published: 10 August 1994
PDF: 11 pages
Proc. SPIE 2158, Oxide Superconductor Physics and Nano-Engineering, (10 August 1994); doi: 10.1117/12.182693
Show Author Affiliations
Yvan Jaccard, IBM Zurich Research Lab. and Univ. de Neuchatel (Switzerland)
Andreas Cretton, IBM Zurich Research Lab. and Univ. de Geneve (Switzerland)
Erica J. Williams, IBM Zurich Research Lab. and Univ. de Geneve (Switzerland)
Jean-Pierre Locquet, IBM Zurich Research Lab. (Switzerland)
Erich Maechler, IBM Zurich Research Lab. (Switzerland)
Christoph Gerber, IBM Zurich Research Lab. (Switzerland)
Toni Schneider, IBM Zurich Research Lab. (Switzerland)
Oystein Fischer, Univ. de Geneve (Switzerland)
Piero Martinoli, Univ. de Neuchatel (Switzerland)


Published in SPIE Proceedings Vol. 2158:
Oxide Superconductor Physics and Nano-Engineering
Davor Pavuna; Ivan Bozovic, Editor(s)

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