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Proceedings Paper

Microanalytical study of defect formation in thin bismuth strontium calcium copper oxide films
Author(s): Richard H. Howell; Alison Chaiken; Ronald G. Musket; Mark A. Wall; Mehdi Balooch; D. Phinney; Michael J. Fluss; J. N. Eckstein; Ivan Bozovic; Gary F. Virshup
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Paper Abstract

Thin bismuth strontium calcium copper oxide (BSCCO) films and BSCCO/insulator/BSCCO trilayers have been prepared on SrTiO3 and MgO substrates by evaporation from elemental sources in ozone atmosphere. Accurate control of the stoichiometry is achieved through monitoring of the atomic fluxes by use of in situ atomic absorption spectroscopy, as well as by reflection high-energy electron diffraction. Nevertheless, nanometer-scale second- phase precipitates are sometimes observed. These defects and the flat regions around them have been probed by a variety of microanalytical techniques, including Rutherford backscattering spectroscopy, particle-induced x-ray emission, atomic force microscopy, microscopic secondary ion mass spectroscopy and transmission electron microscopy.

Paper Details

Date Published: 10 August 1994
PDF: 9 pages
Proc. SPIE 2158, Oxide Superconductor Physics and Nano-Engineering, (10 August 1994); doi: 10.1117/12.182681
Show Author Affiliations
Richard H. Howell, Lawrence Livermore National Lab. (United States)
Alison Chaiken, Lawrence Livermore National Lab. (United States)
Ronald G. Musket, Lawrence Livermore National Lab. (United States)
Mark A. Wall, Lawrence Livermore National Lab. (United States)
Mehdi Balooch, Lawrence Livermore National Lab. (United States)
D. Phinney, Lawrence Livermore National Lab. (United States)
Michael J. Fluss, Lawrence Livermore National Lab. (United States)
J. N. Eckstein, E.H. Ginzton Research Ctr., Varian Associates Inc. (United States)
Ivan Bozovic, E.H. Ginzton Research Ctr., Varian Associates Inc. (United States)
Gary F. Virshup, E.H. Ginzton Research Ctr., Varian Associates Inc. (United States)


Published in SPIE Proceedings Vol. 2158:
Oxide Superconductor Physics and Nano-Engineering
Davor Pavuna; Ivan Bozovic, Editor(s)

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