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Proceedings Paper

Phase shifting in shearing interferometry with double-frequency grating and semiconductor laser to measure temperature field
Author(s): Hai Ming; Zhongyuan Xue; Yu Liu; Chengang Zhou; Bao Yang; Jiangping Xie; Toshinori Nakajima
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Paper Abstract

The shearing interferometry of phase shifting with double frequency grating and semiconductor laser is proposed. By using this technique, the experimental results of the temperature field of a heating plate are obtained and compared with those tested by a thermoelectric couple.

Paper Details

Date Published: 5 August 1994
PDF: 3 pages
Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182184
Show Author Affiliations
Hai Ming, Univ. of Science and Technology of China (China)
Zhongyuan Xue, Univ. of Science and Technology of China (China)
Yu Liu, Univ. of Science and Technology of China (China)
Chengang Zhou, Univ. of Science and Technology of China (China)
Bao Yang, Univ. of Science and Technology of China (China)
Jiangping Xie, Univ. of Science and Technology of China (China)
Toshinori Nakajima, Institute of Physics and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 2321:
Second International Conference on Optoelectronic Science and Engineering '94
Wang Da-Heng; Anna Consortini; James B. Breckinridge, Editor(s)

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