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Proceedings Paper

Measurement error caused by white-light spectrum in fringe scanning interferometry
Author(s): Jiabi Chen; Bichun Zhou
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Paper Abstract

The measurement error caused by white-light spectrum in fringe scanning interferometry is a principle error. This paper presents the analysis of the error and results of computer simulation, which shows that the error is about 20% of measured phase and could not be ignored. Since the error is about linear, the compensation is simply to multiply a constant coefficient.

Paper Details

Date Published: 5 August 1994
PDF: 3 pages
Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182164
Show Author Affiliations
Jiabi Chen, Nanjing Normal Univ. (China)
Bichun Zhou, Nanjing Normal Univ. (China)


Published in SPIE Proceedings Vol. 2321:
Second International Conference on Optoelectronic Science and Engineering '94
Wang Da-Heng; Anna Consortini; James B. Breckinridge, Editor(s)

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