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Proceedings Paper

Electronic speckle pattern shearing interferometry (ESPSI) and its applications
Author(s): Wolfgang Steinchen; Lian Xiang Yang; M. Schuth; Gerhard Kupfer
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Paper Abstract

Since speckle pattern shearing interferometry (SPSI) allows derivatives of surface displacement to be measured directly, it is very useful for non-destructive testing and strain analysis. In conventional SPSI, observation of fringes requires an optical processing of double- exposed interferograms and therefore, this technique is not in real time. This paper presents the development of the SPSI, that is, the technique of electronic speckle pattern shearing interferometry, which enables the shearing interferometric fringes to be observed in real time and to be evaluated quantitatively. Its relevant theory is described and a few applications are also shown in this paper.

Paper Details

Date Published: 5 August 1994
PDF: 4 pages
Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182119
Show Author Affiliations
Wolfgang Steinchen, Univ. Gh-Kassel (Germany)
Lian Xiang Yang, Univ. Gh-Kassel (Germany)
M. Schuth, Univ. Gh-Kassel (Germany)
Gerhard Kupfer, Univ. Gh-Kassel (Germany)

Published in SPIE Proceedings Vol. 2321:
Second International Conference on Optoelectronic Science and Engineering '94
Wang Da-Heng; Anna Consortini; James B. Breckinridge, Editor(s)

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