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Proceedings Paper

Extended target tracking and wavefront-sensing technique using intensity-type correlation masks
Author(s): Luogen Deng
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Paper Abstract

The correlation wavefront sensing technique using extended, arbitrarily structured target as light source is studied. The principle of extended target correlation wavefront sensing employing an intensity-type mask is analyzed. The problems of simulation and selection of target in laboratory experiments are discussed. The methods of generating the mask images from target structure and of preparing the experimental masks from the mask images are presented. The typical results of the mask images generated by processing the target image are given. A first experiment on the extended target wavefront sensing using the intensity-type mask is made. The effects of two different intensity-type masks on wavefront sensing are compared. The experimental results in agreement with the theory are obtained.

Paper Details

Date Published: 5 August 1994
PDF: 4 pages
Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); doi: 10.1117/12.182110
Show Author Affiliations
Luogen Deng, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 2321:
Second International Conference on Optoelectronic Science and Engineering '94
Wang Da-Heng; Anna Consortini; James B. Breckinridge, Editor(s)

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