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Proceedings Paper

Pulsed IR-FEL applications for the characterization of infrared optical materials
Author(s): Richard Mu; Don Otto Henderson; J. Bruce Johnson; Glenn S. Edwards
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Paper Abstract

Theoretical considerations of thermal lens effect due to linear and nonlinear optical absorption is presented. Based on this model, Z-scan technique, especially two-color Z-scan due can be used to detect very low level of impurities or defects in optical materials. Depending upon the optical cross section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.

Paper Details

Date Published: 27 July 1994
PDF: 10 pages
Proc. SPIE 2138, Longer Wavelength Lasers and Applications, (27 July 1994); doi: 10.1117/12.181347
Show Author Affiliations
Richard Mu, Fisk Univ. (United States)
Don Otto Henderson, Fisk Univ. (United States)
J. Bruce Johnson, Vanderbilt Univ. (United States)
Glenn S. Edwards, Vanderbilt Univ. (United States)


Published in SPIE Proceedings Vol. 2138:
Longer Wavelength Lasers and Applications
Gabor Patonay, Editor(s)

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