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Proceedings Paper

Picosecond light-pulse-induced damage to diamond
Author(s): Claude A. Klein; Richard P. Miller; Richard John DeSalvo
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Paper Abstract

We report on picosecond laser-induced damage experiments that were carried out on a natural type-IIa diamond and a thick specimen of high-quality chemically vapor-deposited (CVD) diamond. In conjunction with earlier measurements performed elsewhere on an `optically thick' single crystal, it is shown that for spot sizes (2 (omega) ) ranging from 3 to 60 micrometers , the breakdown field strength (EBD) at the damage threshold of diamond obeys a pattern best described as follows: EBD approximately equals A/(root)2(omega) , where A equals 30.7 and 38.7 MV(mu) 1/2/cm at 532 and 1064 nm, respectively. The case of CVD diamond demonstrates that, if problems arising from localized high absorption at the deposition surface can be avoided, this material should be of much promise for contemplated high-power free-electron laser window applications. We show that corrections for self- focusing in laser damage experiments depend not only on the peak pulse power but also on the position of the diffraction prefocus and the length of the Rayleigh range.

Paper Details

Date Published: 28 July 1994
PDF: 11 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180932
Show Author Affiliations
Claude A. Klein, Raytheon Co. (United States)
Richard P. Miller, Raytheon Co. (United States)
Richard John DeSalvo, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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