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Proceedings Paper

Distributions of local electric fields in inhomogeneous media
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Paper Abstract

The complex microstructure of dielectric films alters the local electric fields affecting both the strength by which different sites within a film interact, and the spatial extent. Using our self- consistent lattice element model, we determined the site by site interaction of the local electric fields within a defect ridden dielectric film to determine the effects of microstructure on the interaction of defects sites on its surroundings. Local dielectric properties are compared to currently accepted models of dielectric film properties (such as effective medium methods) determine the local field and polarization.

Paper Details

Date Published: 28 July 1994
PDF: 9 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180930
Show Author Affiliations
Kim F. Ferris, Pacific Northwest Lab. (United States)
Gregory J. Exarhos, Pacific Northwest Lab. (United States)
Steven M. Risser, East Texas State Univ. (United States)


Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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