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Proceedings Paper

Monte-Carlo-based calculation of measurement quality for three variants of the damage frequency method
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Paper Abstract

This paper quantifies the measurement quality, Q, of three test procedures by simulating a series of correlation experiments and employing a Monte Carlo technique. The three methods compared are the ISO standard damage frequency method (DFM), the DFM yielding the highest Q (optimal DFM) and a modified DFM. For each trial, two values of the normalized damage threshold and uncertainty are derived via a PC spreadsheet based Monte Carlo simulation. To simulate various sets of real optics, the normalized results are multiplied by a set of uniformly distributed random numbers which are unique to each trial. The slope of the correlation line for each test procedure is determined via a weighted linear regression, and recorded. The output of the model is a frequency distribution of the slopes of the correlation lines for each procedure. Comparing the distributions of the slopes of the correlations is a direct measure of Q2 for each test procedure. It is shown that a revised DFM results in a much higher likelihood of making an accurate measurement with a given precision.

Paper Details

Date Published: 28 July 1994
PDF: 12 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180901
Show Author Affiliations
Jonathan W. Arenberg, TRW Space and Technology Group (United States)


Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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