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Proceedings Paper

To scale or not to scale
Author(s): Arthur H. Guenther; John K. McIver
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Paper Abstract

Herein is reviewed the utility of scaling relations and pitfalls to be avoided in their application. This is illustrated by recourse to a discussion of selected proposed scaling relationships including their range of validity, experimental foundation and efficacy in determining the basis of fundamental physical interaction processes. The latter is illustrated using the scaling of damage threshold with the duration of an incident laser pulse. It is shown that for a defect dominated pulsed laser interaction mechanism, the pulse length scaling dependence can change over a narrow range due to a variation of the characteristics of the defect which is most sensitive or easiest to damage under the experimental conditions of import even though the gross aspects of the interaction mechanism do not change appreciably.

Paper Details

Date Published: 28 July 1994
PDF: 12 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180899
Show Author Affiliations
Arthur H. Guenther, Sandia National Labs. (United States)
John K. McIver, Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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