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Proceedings Paper

Photocarrier diffusion at a Si(111) surface studied by reflective two-color transient grating scattering
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Paper Abstract

The dynamics of photocarrier diffusion was studied by a two color transient grating technique in reflection geometry. A single exponential decay feature was observed immediately following the electron excitation pulse and was attributed to band edge carrier diffusion.

Paper Details

Date Published: 21 July 1994
PDF: 4 pages
Proc. SPIE 2125, Laser Techniques for Surface Science, (21 July 1994); doi: 10.1117/12.180864
Show Author Affiliations
C. M. Li, Univ. of Pennsylvania (United States)
Z. Charles Ying, Univ. of Pennsylvania (United States)
Theodore A. Sjodin, Univ. of Pennsylvania (United States)
Hai-Lung Dai, Univ. of Pennsylvania (United States)

Published in SPIE Proceedings Vol. 2125:
Laser Techniques for Surface Science
Hai-Lung Dai; Steven J. Sibener, Editor(s)

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