Share Email Print
cover

Proceedings Paper

Verification, validation, and accreditation issues related to a new IR sensor test capability
Author(s): Parker David Elrod; Heard S. Lowry; Gary R. Mattasits
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Arnold Engineering Development Center (AEDC) has developed new test technologies and methodologies for realistic mission simulations testing of IR space-based sensors. These technologies and methodologies have been combined into an integrated approach for space sensor testing. Direct write scene generation plays a critical role in this integrated approach and is being applied in two new AEDC test facilities. Prior to performing the first test in such a new facility, a critical but often overlooked process must be completed. This critical process demonstrates that the test facility can indeed provide a realistic, NIST traceable simulation of a sensor's mission. This process is complex and must be uniquely tailored for each individual test facility and sensor mission. Such a process can be designed to address both developmental test and evaluation and operational test and evaluation concerns. A case study based on AEDC's direct write scene generation technology will be used to illustrate the issues related to the validation, verification, and accreditation process.

Paper Details

Date Published: 8 July 1994
PDF: 9 pages
Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); doi: 10.1117/12.180079
Show Author Affiliations
Parker David Elrod, Arvin/Calspan Corp. (United States)
Heard S. Lowry, Arvin/Calspan Corp. (United States)
Gary R. Mattasits, Arnold Engineering Development Ctr. (United States)


Published in SPIE Proceedings Vol. 2224:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V
Gerald C. Holst, Editor(s)

© SPIE. Terms of Use
Back to Top