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Proceedings Paper

Tandem limiter optimization
Author(s): David J. Hagan; Tie Jun Xia; Ali A. Said; Eric W. Van Stryland
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Paper Abstract

The EZ-scan, an improved Z-scan technique, shows a sensitivity for measuring nonlinearly induced wavefront distortion of approximately equals (lambda) /104. We show that the nonlinear refraction and nonlinear absorption coefficients can be determined separately by a single EZ-scan measurement. We describe application of this technique to several organic thin films.

Paper Details

Date Published: 6 July 1994
PDF: 12 pages
Proc. SPIE 2229, Nonlinear Optical Materials for Switching and Limiting, (6 July 1994); doi: 10.1117/12.179584
Show Author Affiliations
David J. Hagan, CREOL/Univ. of Central Florida (United States)
Tie Jun Xia, CREOL/Univ. of Central Florida (United States)
Ali A. Said, CREOL/Univ. of Central Florida (United States)
Eric W. Van Stryland, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 2229:
Nonlinear Optical Materials for Switching and Limiting
M. J. Soileau, Editor(s)

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