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Proceedings Paper

Diffraction efficiency of binary optical elements
Author(s): J. Allen Cox; Thomas R. Werner; James C. Lee; Scott A. Nelson; Bernard S. Fritz; James W. Bergstrom
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Paper Abstract

We examine the role of processing errors on diffraction efficiency of binary optical elements and the validity of the Fourier model to predict diffraction efficiency. We show that mask alignment error can significantly degrade efficiency. Models based on the Fourier theory can adequately predict both the magnitude of diffraction efficiency and its sensitivity to processing errors for optically slow elements (f/b). For optically fast elements (

Paper Details

Date Published: 1 May 1990
PDF: 9 pages
Proc. SPIE 1211, Computer and Optically Formed Holographic Optics, (1 May 1990); doi: 10.1117/12.17953
Show Author Affiliations
J. Allen Cox, Honeywell Systems and Research Ctr. (United States)
Thomas R. Werner, Honeywell Systems and Research Ctr. (United States)
James C. Lee, Honeywell Systems and Research Ctr. (United States)
Scott A. Nelson, Honeywell Systems and Research Ctr. (United States)
Bernard S. Fritz, Honeywell Systems and Research Ctr. (United States)
James W. Bergstrom, Honeywell Systems and Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1211:
Computer and Optically Formed Holographic Optics
Ivan Cindrich; Sing H. Lee, Editor(s)

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