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Proceedings Paper

Measured characteristics of the reflected magneto-optic spatial light modulator (R-MOSLM TM) device
Author(s): William E. Ross; James P. Karins; Theodore R. Maki; John R. Lucas; Louis G. Kelly; Niels Jacksen; Jaekyong Cho; David N. Lambeth; Tan Le; Keith Mountfield; Suresh Santhanam; Daniel D. Stancil; Mark H. Randles; Jonathan B. Whitlock; Dennis J. Garrity
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Paper Abstract

This paper is a report on the characteristics of a new high resolution, high frame rate, reflected R-MOSLM. This effort is aimed at the production of Miniature Ruggedized Optical Correlators for Optical Pattern Recognition. Pixel size is under one mil center to center, one-third the dimension of present transmission mode devices, thereby reducing the optical path length by an order of magnitude. This development includes optimization of the optical and functional characteristics of the MOSLM for Mil Spec Systems.

Paper Details

Date Published: 29 June 1994
PDF: 7 pages
Proc. SPIE 2240, Advances in Optical Information Processing VI, (29 June 1994); doi: 10.1117/12.179134
Show Author Affiliations
William E. Ross, Litton Data Systems (United States)
James P. Karins, Litton Data Systems (United States)
Theodore R. Maki, Litton Data Systems (United States)
John R. Lucas, Litton Data Systems (United States)
Louis G. Kelly, Litton Data Systems (United States)
Niels Jacksen, Litton Electron Devices (United States)
Jaekyong Cho, Carnegie Mellon Univ. (United States)
David N. Lambeth, Carnegie Mellon Univ. (United States)
Tan Le, Carnegie Mellon Univ. (United States)
Keith Mountfield, Carnegie Mellon Univ. (United States)
Suresh Santhanam, Carnegie Mellon Univ. (United States)
Daniel D. Stancil, Carnegie Mellon Univ. (United States)
Mark H. Randles, Litton Airtron (United States)
Jonathan B. Whitlock, Litton Airtron (United States)
Dennis J. Garrity, Litton Airtron (United States)


Published in SPIE Proceedings Vol. 2240:
Advances in Optical Information Processing VI
Dennis R. Pape, Editor(s)

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