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Proceedings Paper

Submicron diffraction gratings etched on an InP/InGaAsP waveguide edge for wavelength division multiplexing
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Paper Abstract

2D monolithic grating spectrometers for dense wavelength division multiplexing (WDM) show considerable promise to extend the usable bandwidth of optical fibers. Their performance is fundamentally dictated by the grating which is used. First order gratings will theoretically improve the performance of monolithic WDM devices, since WDM devices based on first order gratings do not suffer from an inherent tradeoff between efficiency and broadband operation.

Paper Details

Date Published: 29 June 1994
PDF: 10 pages
Proc. SPIE 2240, Advances in Optical Information Processing VI, (29 June 1994); doi: 10.1117/12.179126
Show Author Affiliations
Elizabeth J. Twyford, Georgia Institute of Technology (United States)
Nan Marie Jokerst, Georgia Institute of Technology (United States)
Paul A. Kohl, Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 2240:
Advances in Optical Information Processing VI
Dennis R. Pape, Editor(s)

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