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Proceedings Paper

Quantification of clutter in electro-optical tracking systems
Author(s): Gillian K. Groves; Kim M. Chacon; Kenneth E. Prager; Larisa Stephan
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Paper Abstract

A novel wavelet transform based clutter measurement technique correlates remarkably well with imaging tracker performance. To determine the robustness of automated tracking algorithms we need a quantitative measure of ground clutter complexity. Current tracking and detection system performance is often specified against signal-to-noise ratio, which is sensor related, and provides no information regarding the scene content. A signal-to- clutter ratio (SCR) can specify the degree to which the target signal is discernible from the background. In the context of electro-optical imaging systems, clutter is defined as objects or scene phenomena that interfere with target detection and tracking. Scene clutter is endemic to imaging systems, yet limited useful work has been performed to measure it. Clutter complexity is usually determined subjectively, and in reference to the object of interest. We devised a clutter measure that is quantitative and also independent of the object of interest. Based on this measure, we also developed a SCR, which is used to analyze detection and tracking performance, and allows prediction of target tracking performance in given clutter levels for particular target signatures. We present results of imaging target tracking performance with respect to target signatures for a given target in various clutter levels.

Paper Details

Date Published: 5 July 1994
PDF: 8 pages
Proc. SPIE 2221, Acquisition, Tracking, and Pointing VIII, (5 July 1994); doi: 10.1117/12.178939
Show Author Affiliations
Gillian K. Groves, Hughes Aircraft Co. (United States)
Kim M. Chacon, Hughes Aircraft Co. (United States)
Kenneth E. Prager, Hughes Aircraft Co. (United States)
Larisa Stephan, Hughes Aircraft Co. (United States)

Published in SPIE Proceedings Vol. 2221:
Acquisition, Tracking, and Pointing VIII
Michael K. Masten; Larry A. Stockum; Morris M. Birnbaum; George E. Sevaston, Editor(s)

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