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Proceedings Paper

Characterization and nonuniformity correction of a resistor array infrared scene projector
Author(s): Robert G. Stockbridge; George C. Goldsmith; David G. Edwards; Andrew W. Guertin; Lawrence E. Jones; Eric M. Olson
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Paper Abstract

Ever increasing developments in imaging infrared (IR) seekers that are being designed for Ballistic Missile Defense Office (BMDO) guided interceptor programs have amplified the necessity for robust hardware-in-the-loop (HWIL) testing to reduce program risk. Several candidate HWIL IR projection technologies are under development. This paper addresses the characterization measurements of a 128 X 128 metal-oxide semiconductor field-effect transistor (MOSFET) resistor array scene projector. The measurements include spectral output performance, dynamic range, spectral apparent temperature, uniformity, rise time, fall time, droop percentage, and current consumption. With possibly the exception of hot target simulation, the resistor array has the ability to spatially, spectrally, and temporarily function as the scene projector for a HWIL facility.

Paper Details

Date Published: 15 June 1994
PDF: 12 pages
Proc. SPIE 2223, Characterization and Propagation of Sources and Backgrounds, (15 June 1994); doi: 10.1117/12.177945
Show Author Affiliations
Robert G. Stockbridge, Air Force Wright Lab. (United States)
George C. Goldsmith, Guided Weapons Evaluation Directorate (United States)
David G. Edwards, Guided Weapons Evaluation Directorate (United States)
Andrew W. Guertin, Vitro Technical Services (United States)
Lawrence E. Jones, Science Applications International Corp. (United States)
Eric M. Olson, Science Applications International Corp. (United States)


Published in SPIE Proceedings Vol. 2223:
Characterization and Propagation of Sources and Backgrounds
Wendell R. Watkins; Dieter Clement, Editor(s)

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