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Proceedings Paper

Use of the NIST-developed water calibrator for the Midcourse Space Experiment (MSX) mass spectrometer
Author(s): O. Manuel Uy; Richard C. Benson; Mark T. Boies; James D. Kinnison; John S. Morgan; Stuart A. Tyson; Albert R. Filippelli; Charles R. Tilford
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Paper Abstract

The absolute measurement of low-density gases of interest in space experiments recently underwent a major advanced when the National Institute of Standards and Technology developed a primary standard for low-density water vapor. This standard, which features arrays of laser-drilled holes, was used to calibrate and characterize the performance of several vacuum instruments and the MSX neutral mass spectrometer. The neutral mass spectrometer will be used to measure the absolute densities of molecules outgassing from the MSX spacecraft during orbit and, thus, to validate the MSX contamination models and the effectiveness of the contamination control plan. The residual gas analyzers and the flight mass spectrometer were tested over a large range of partial pressures of H2O, H2He, N2, O2, and Ar. In certain cases, water vapor caused significant changes in the sensitivity of vacuum instruments and generated several other gaseous species.

Paper Details

Date Published: 8 June 1994
PDF: 9 pages
Proc. SPIE 2214, Space Instrumentation and Dual-Use Technologies, (8 June 1994); doi: 10.1117/12.177673
Show Author Affiliations
O. Manuel Uy, Johns Hopkins Univ. (United States)
Richard C. Benson, Johns Hopkins Univ. (United States)
Mark T. Boies, Johns Hopkins Univ. (United States)
James D. Kinnison, Johns Hopkins Univ. (United States)
John S. Morgan, Johns Hopkins Univ. (United States)
Stuart A. Tyson, National Institute of Standards and Technology (United States)
Albert R. Filippelli, National Institute of Standards and Technology (United States)
Charles R. Tilford, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 2214:
Space Instrumentation and Dual-Use Technologies
Firooz A. Allahdadi; Michael Chrisp; Concetto R. Giuliano; W. Pete Latham; James F. Shanley, Editor(s)

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