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Proceedings Paper

Survivability of quantum well optoelectronic devices for space applications
Author(s): Bruce D. Evans
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Paper Abstract

Evaluation of threshold-shift damage factors versus non-ionizing energy deposition for GaAs-based, quantum-well, laser diodes and light-emitting diodes demonstrates that they obey the relation between damage factors and non-ionizing energy loss established for GaAs-based electronic devices.

Paper Details

Date Published: 8 June 1994
PDF: 6 pages
Proc. SPIE 2215, Photonics for Space Environments II, (8 June 1994); doi: 10.1117/12.177643
Show Author Affiliations
Bruce D. Evans, Boeing Defense & Space Group (United States)

Published in SPIE Proceedings Vol. 2215:
Photonics for Space Environments II
Edward W. Taylor, Editor(s)

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