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Proceedings Paper

Lidar and DOAS remote sensing for pollution monitoring in the Washingto D.C. area during August/September 1992
Author(s): Cyril Flamant; Thomas D. Wilkerson; Willard E. Fraize; Coorg R. Prasad; Joseph Famiglietti
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Paper Abstract

As a result of the development of a new air pollution measurement capability, we present observations of air pollution parameters in the Baltimore/Washington, D.C. area for the months of August and September 1992, requested by the Air and Radiation Management Administration, State of Maryland Department of the Environment (MDE). The measured parameters are (1) the height of the atmospheric boundary layer (BL) as determined by lidar (laser backscatter by aerosols) and (2) the concentration of the major gaseous pollutants (O3, SO2, and NO2) as determined by long-path differential optical absorption spectroscopy. Selected results are presented in pictorial, graphical, and tabular forms, and are compared with each other and with observations taken with other pollutant and meteorological instruments operating in the same region and time period. Complete data have been provided to the MDE for Urban Airshed Model calculations. Early results are promising on correlations between BL parameters and pollutant concentration; this relatively recent study is still underway.

Paper Details

Date Published: 3 June 1994
PDF: 8 pages
Proc. SPIE 2112, Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements, (3 June 1994); doi: 10.1117/12.177307
Show Author Affiliations
Cyril Flamant, Univ. of Maryland/College Park (United States)
Thomas D. Wilkerson, Univ. of Maryland/College Park (United States)
Willard E. Fraize, MITRE Corp. (United States)
Coorg R. Prasad, Science and Engineering Services, Inc. (United States)
Joseph Famiglietti, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 2112:
Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements
Alan Fried; Dennis K. Killinger; Harold I. Schiff, Editor(s)

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