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Proceedings Paper

Wafer scale testing of vertical cavity surface-emitting laser arrays
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Paper Abstract

We have applied automated wafer scale testing methods to the characterization of arrays of vertical cavity surface emitting semiconductor lasers. The hardware and software for recording light versus current, current versus voltage, optical spectra, and high speed modulation performance are described.

Paper Details

Date Published: 1 June 1994
PDF: 7 pages
Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); doi: 10.1117/12.176642
Show Author Affiliations
Thaddeus G. Dziura, Lockheed Palo Alto Research Lab. (United States)
S. C. Wang, Lockheed Palo Alto Research Lab. (Taiwan)


Published in SPIE Proceedings Vol. 2148:
Laser Diode Technology and Applications VI
Pei Chuang Chen; Lawrence A. Johnson; Henryk Temkin, Editor(s)

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