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Proceedings Paper

Curvature-based wavefront sensor for use on extended patterns
Author(s): Renate Kupke; Francois J. Roddier; Donald L. Mickey
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Paper Abstract

We present results of simulations involving a curvature-based wavefront sensor which uses an extended pattern as a reference source. The proposed sensor provides measurements of both symmetric and asymmetric aberration terms by comparing the Fourier transforms of two oppositely defocused images. Symmetric terms such as defocus and astigmatism can be measured without regard to the object distribution. The asymmetric terms, such as tip and tilt, rely on averaging the signal over many atmospheric realizations in order to determine the object phase, or on defining an arbitrary reference phase. Only after removal of the object Fourier transform phase can the asymmetric terms be identified. Although this paper reports on preliminary results, we believe the proposed sensor will be useful for both real-time compensation of atmospheric distortions while imaging the Sun, and post-facto compensation of optical misalignments in Earth-pointing satellites.

Paper Details

Date Published: 31 May 1994
PDF: 9 pages
Proc. SPIE 2201, Adaptive Optics in Astronomy, (31 May 1994); doi: 10.1117/12.176087
Show Author Affiliations
Renate Kupke, Univ. of Hawaii Institute for Astronomy (United States)
Francois J. Roddier, Univ. of Hawaii Institute for Astronomy (United States)
Donald L. Mickey, Univ. of Hawaii Institute for Astronomy (United States)

Published in SPIE Proceedings Vol. 2201:
Adaptive Optics in Astronomy
Mark A. Ealey; Fritz Merkle, Editor(s)

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