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Proceedings Paper

Adaptive optics at the University of Hawaii IV: a photon-counting curvature wavefront sensor
Author(s): J. Elon Graves; Francois J. Roddier; Malcolm J. Northcott; Jim Anuskiewicz; Guy J. Monnet
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Paper Abstract

A photon counting wavefront curvature sensor (WFS) with 13 subapertures suitable for adaptive optics in astronomy has been developed at the University of Hawaii. This sensor is capable of using very faint point sources or slightly extended sources to derive the wavefront signal. The sensitivity of this sensor is continuously variable and can be adjusted in real time to match the seeing conditions at the time. The wavefront sampling geometry has been optimized for correcting the standard atmosphere up to 9 orders expressed in terms of Zernike's. Its output is used in conjunction with a newly developed deformable bimorph mirror for high efficiency correction capabilities. This WFS has successfully been used recently at the CFHT and UKIRT facilities on Mauna Kea on a variety of astronomical objects. Point sources, double stars, planetary nebula, galactic nuclei, and some of the moons of Jupiter have all been successfully attempted. Limiting magnitude has not been explored in great detail at the telescope, but we have taken the system down to magnitude R equals 13.7 (V equals 15) with a 3.6 meter aperture with success. This was achieved during bright time or whilst the full moon was present.

Paper Details

Date Published: 31 May 1994
PDF: 6 pages
Proc. SPIE 2201, Adaptive Optics in Astronomy, (31 May 1994); doi: 10.1117/12.176085
Show Author Affiliations
J. Elon Graves, Univ. of Hawaii Institute for Astronomy (United States)
Francois J. Roddier, Univ. of Hawaii Institute for Astronomy (United States)
Malcolm J. Northcott, Univ. of Hawaii Institute for Astronomy (United States)
Jim Anuskiewicz, Univ. of Hawaii Institute for Astronomy (United States)
Guy J. Monnet, Canada-France-Hawaii Telescope Corp. (Germany)


Published in SPIE Proceedings Vol. 2201:
Adaptive Optics in Astronomy
Mark A. Ealey; Fritz Merkle, Editor(s)

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