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Proceedings Paper

Ultrafast scanning probe microscopy
Author(s): David Botkin; Shimon Weiss; D. Frank Ogletree; Miguel Salmeron; Daniel S. Chemla
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Paper Abstract

We have developed a general technique that combines the temporal resolution of ultrafast laser spectroscopy with the spatial resolution of scanned probe microscopy (SPM). Using this technique with scanning tunneling microscopy (STM), we have obtained simultaneous 2 ps time resolution and 50 angstrom spatial resolution. This improves the time resolution currently attainable with STM by nine orders of magnitude. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution is discussed.

Paper Details

Date Published: 16 May 1994
PDF: 7 pages
Proc. SPIE 2116, Generation, Amplification, and Measurement of Ultrashort Laser Pulses, (16 May 1994); doi: 10.1117/12.175874
Show Author Affiliations
David Botkin, Univ. of California/Berkeley (United States)
Shimon Weiss, Univ. of California/Berkeley (United States)
D. Frank Ogletree, Lawrence Berkeley Lab. (United States)
Miguel Salmeron, Lawrence Berkeley Lab. (United States)
Daniel S. Chemla, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 2116:
Generation, Amplification, and Measurement of Ultrashort Laser Pulses
Rick P. Trebino; Ian A. Walmsley, Editor(s)

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