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Proceedings Paper

Re-emitted positron spectroscopy as a structural probe of metal overlayer systems: Pd/Cu(100)
Author(s): Geoffrey W. Anderson; Kjeld O. Jensen; Peter R. Norton; Peter J. Schultz
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Paper Abstract

The growth and annealing properties of Pd overlayers on Cu(100) have been investigated using re-emitted positron spectroscopy, low energy electron diffraction, and Rutherford backscattering spectroscopy. Two changes in the growth mode of the Pd overlayers have been observed at approximately 0.5 and approximately 1 monolayer Pd coverage. These changes correspond to the completion of the first and second alloy layers, the latter also being associated with the beginning of the growth of bulk Pd. The bulk Pd film does not grow in an epitaxial manner and was found to contain approximately 1% vacancy defects. For 0.5 monolayer Pd/Cu(100) overlayers annealing at 353 K has been observed to result in the loss of Pd from the surface to the bulk and the removal of defects associated with the overlayer.

Paper Details

Date Published: 11 May 1994
PDF: 11 pages
Proc. SPIE 2140, Epitaxial Growth Processes, (11 May 1994); doi: 10.1117/12.175780
Show Author Affiliations
Geoffrey W. Anderson, Univ. of Western Ontario (Canada)
Kjeld O. Jensen, Univ. of Western Ontario (Canada)
Peter R. Norton, Univ. of Western Ontario (Canada)
Peter J. Schultz, Univ. of Western Ontario (Canada)


Published in SPIE Proceedings Vol. 2140:
Epitaxial Growth Processes
Chris J. Palmstrom; Maria C. Tamargo, Editor(s)

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