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Proceedings Paper

Modern high-speed measurement techniques
Author(s): Brian H. Kolner
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Paper Abstract

Today's high-speed electronic devices and networks challenge the capabilities of commercially available test instrumentation. Modern techniques using ultrashort light pulses and electron beams are now routinely used to characterize these fast circuits but are not without their limitations. In this paper I discuss the performance characteristics common to all these measurement techniques and compare some of them in a context that will be applicable to future techniques as they develop.

Paper Details

Date Published: 2 May 1994
PDF: 18 pages
Proc. SPIE 2149, Technologies for Optical Fiber Communications, (2 May 1994); doi: 10.1117/12.175248
Show Author Affiliations
Brian H. Kolner, Univ. of California/Los Angeles (United States)


Published in SPIE Proceedings Vol. 2149:
Technologies for Optical Fiber Communications
Gail J. Brown; Susan R. Sloan; Kenneth D. Pedrotti; Didier J. Decoster; Didier J. Decoster; Joanne S. LaCourse; Yoon-Soo Park; Kenneth D. Pedrotti; Susan R. Sloan, Editor(s)

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