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Proceedings Paper

Methods for CCD camera characterization
Author(s): James C. Mullikin; Lucas J. van Vliet; H. Netten; Frank R. Boddeke; G. van der Feltz; Ian T. Young
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Paper Abstract

In this paper we present methods for characterizing CCD cameras. Interesting properties are linearity of photometric response, signal-to-noise ratio, sensitivity, dark current, and spatial frequency response. The techniques to characterize CCD cameras are carefully designed to assist one in selecting a camera to solve a certain problem. The methods described were applied to a variety of cameras: an Astromed TE3/A with P86000 chip, a Photometrics CC200 series with Thompson chip TH7882, a Photometrics CC200 series with Kodak chip KAF1400, a Xillix' Micro Imager 1400 with Kodak chip KAF1400, an HCS MXR CCD with a Philips chip and a Sony XC-77RRCE.

Paper Details

Date Published: 5 May 1994
PDF: 12 pages
Proc. SPIE 2173, Image Acquisition and Scientific Imaging Systems, (5 May 1994); doi: 10.1117/12.175165
Show Author Affiliations
James C. Mullikin, Delft Univ. of Technology (Netherlands) and Lawrence Berkeley Lab. (United States)
Lucas J. van Vliet, Delft Univ. of Technology (Netherlands)
H. Netten, Delft Univ. of Technology (Netherlands)
Frank R. Boddeke, Delft Univ. of Technology (Netherlands)
G. van der Feltz, Delft Univ. of Technology (Netherlands)
Ian T. Young, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 2173:
Image Acquisition and Scientific Imaging Systems
Helen C. Titus; Amir Waks, Editor(s)

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