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Proceedings Paper

Remote imaging in the ultraviolet using intensified and nonintensified CCDs
Author(s): Bruce B. Glasgow; Michael S. Glaser; Robert H. Whitley
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Paper Abstract

Recent advances in charge-coupled device (CCD) coatings and manufacturing have resulting in CCDs sensitive to short UV wavelengths. These UV-enhanced CCDs can be used to image in the UV without the negative attributes of the intensified systems. This paper compares the characteristics of two systems: (1) a non-intensified UV-enhanced CCD sensor system, and (2) an intensified sensor system using a photocathode/micro-channel plate (MCP)/fiber optic bundle with a high quantum efficiency CCD. Both sensor systems have advantages and disadvantages in terms of noise performance; and the better choice is very much dependent on mission requirements. The results of the analysis illustrate parametrically the performance for both intensified and non-intensified sensor systems as a function of light level and range to target. Additionally, other sensor system noise parameters are discussed such as photo-cathode and CCD dark current, charge transfer efficiency, readout rate, and ADC quantization. For the analysis, a detailed computer model was constructed to account for all relevant intensifier, CCD, and electronics noise. The computer model is described, and the details of accounting for intensifier gain, photocathode noise, and CCD performance are discussed. Finally, the sensor system model is used along with atmospheric transmission predictions to estimate the NET of the UV sensor system (both intensified and non-intensified) operating through the atmosphere where UV attenuation is quite high. The predictions are valid against a wide range of remote sensing requirements, and the computer model constructed is generic with respect to remote sensing missions.

Paper Details

Date Published: 5 May 1994
PDF: 12 pages
Proc. SPIE 2173, Image Acquisition and Scientific Imaging Systems, (5 May 1994); doi: 10.1117/12.175151
Show Author Affiliations
Bruce B. Glasgow, Georgia Tech Research Institute (United States)
Michael S. Glaser, Georgia Tech Research Institute (United States)
Robert H. Whitley, TRW Space and Electronics Group (United States)

Published in SPIE Proceedings Vol. 2173:
Image Acquisition and Scientific Imaging Systems
Helen C. Titus; Amir Waks, Editor(s)

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